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A Development Methodology for Copper End Termination Paste — Part 1: Origin of Green Defects
capacitor termination ceramic capacitors Ni based electrodes green defects
2001/12/1
Copper (Cu) based pastes have emerged as the termination materials of choice for ceramic capacitors with base metal internal electrodes. To prevent oxidation of nickel (Ni) internal electrode and the ...
Modeling of Surface Potential and Threshold Voltage of LDD nMOSFET's with Localized Defects
Surface potential Threshold voltage LDD nMOSFET Defects
2000/7/12
We propose a model of the surface potential and the threshold voltage for submicron lightly-doped drain LDD nMOSFET’s in relation with the localized defects at the interface Si–SiO2 in the overlap n&#...