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Simulation of Open Circuit Voltage Decay for Solar Cell Determination of the Base Minority Carrier Lifetime and the Back Surface Recombination Velocity
Open Circuit Voltage Solar Cell the Base Minority Carrier Lifetime the Back Surface Recombination Velocity
1996/3/29
The Open Circuit Voltage Decay (OCVD) method for the determination of the base minority carrier lifetime (τ ) and the back surface recombination velocity (S) of silicon solar cells has been investigat...