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MAPPING VIS AND UVL IMAGERY ON 3D GEOMETRY FOR NON-INVASIVE, NON-CONTACT ANALYSIS OF A VASE
Ultraviolet-induced luminescence multispectral imaging 3D modelling non-invasive analysis fringe projection photogrammetry dense matching cultural heritage
2018/3/30
The paper presents an investigation about the combination of multispectral and 3D imaging aiming at the analysis of the condition and preservation of an ancient vase. Visible-reflected (VIS) and -indu...
第20届非接触原子力显微镜国际会议（20th International Conference on Non-Contact Atomic Force Microscopy）
第20届 非接触原子力 显微镜 国际会议
2017/7/6
NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
Non-contact detection for quantity-insufficiency in tablet counting machine
light reflection tablet-missed moving pits
2009/1/6
A non-contact method based on light reflection was developed to detect quantity-insufficiency information of the tablet counting machine in medicine packaging industry. The incident light beam coming ...