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2017 SPIE X射线和EUV光学计量学进展专题会议（Advances in Metrology for X-Ray and EUV Optics VII）
2017 SPIE X射线 EUV光学计量学进展 专题会议
2017/4/25
Conference Sessions:1: At-Wavelength Metrology ;2: Metrology of VLS Gratings Technology Hot Topics: How Optics and Photonics Drive Innovation ;3: Calibration and Nanoradian Metrology ;4: Metrology Fac...
Genetic Approach for the Determination of Object Parameters from X Ray Projections
Genetic Approach Object Parameters X Ray Projections
2009/7/27
In this study, a new method is presented, based on genetic algorithms for determining object parameters such as radii and/or attenuation coefficients with some assumptions and estimating a cross-secti...
X-Ray source which can simultaneously detect spectral and spatial variations could have huge benefits for medical research
X-Ray beam Optoelectronics
2007/2/12
05 February 2007，A pioneering technique which for the first time allows simultaneous detection of both the spectral and spatial variation of an X-ray beam has been developed by researchers at the Univ...
X-Ray Reflectivity Study of Reactive DC Sputter Deposited Al2O3 Thin Films
X-Ray Reflectivity Reactive DC Sputter Al2O3 Thin Films
1993/4/12
X-ray reflection was performed on Al2O3 thin films obtained by dc magnetron sputtering of aluminium in an argon/oxygen atmosphere. Two kind of films (amorphous and γ-Al2O3) were deposited on polished ...