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SPIE appoints Chris Mack editor of 'Journal of Micro/Nanolithography, MEMS, and MOEMS'
SPIE Micro/Nanolithography MEMS MOEMS
2011/2/17
SPIE has announced the appointment of renowned lithography expert Chris A. Mack, adjunct faculty member at the University of Texas at Austin, as editor of the Journal of Micro/Nanolithography, MEMS, a...